光学轮廓仪 GT-K0

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ContourGT Surface Metrology Product Family光学轮廓仪 
产品简介：
ContourGT系列结合先进的64-bit,多核操作和分析软件，专利白色光源干涉测量(WLI)硬件和前所未有的操作简易性，展现出历史以来*先进的3D光学表面轮廓仪系统。第十代光学表面轮廓仪提供了超大视野埃米至毫米垂直范围计量，样品灵活安装和领先可重复等性能。ContourGT系列是当今生产研究和质量控制应用中，*广泛使用和*直观的3D表面计量平台。
产品详细信息：
利用超过业界*大视野*高垂直分辨率，达到无与伦比的测量性能
■ 从0.5倍到200倍的放大率能够表示大范围样品表面形状与结构特征
■ 任意放大率下亚埃米到毫米垂直范围能提供无与伦比的测量灵活性
■ 高分辨率相机选项提高横向分辨率，增加R&R测量性能
运用Vision64?软件的64-Bit, 多核处理器可加速3D表面测量和分析
■ *新型结构产量功能可大幅增加应用数据处理能力
■ 运用多核优化和其他技术的并行处理功能，可以提供高达10倍的判断性计量分析输出量
■ 无与伦比的拼接性能无间断地将大量单独数据综合设置成一个连续图像
生产环境中提高可靠性和可重复性的独特计量硬件
■ 超高亮度LED专利双源照明系统提供卓越的测量质量放大率挠度
■ 优化硬件设计可提供震动偏差R&R测量
■ 选择模式中专利自动化自校准功能可获得工具间相关性和测量准确可靠性
高度直观用户平台，拥有*一流易用性，自动化和分析能力
■ 简易高效用户界面简化测量与数据采集操作，提高人机工作效率
■ 独特可视工作流程工具可直观获得过滤和分析选项扩展库
■ 为客户具体要求设置客户报告提炼分析数据功能

Optical Surface Profiler Family 
The ContourGT? Family combines advanced 64-bit, multi-core operation and analysis software, patented white light 
interferometric (WLI) hardware, and unprecedented operator ease-of-use to deliver the most advanced 3D optical surface 
profilers ever developed. Veeco’s tenth-generation surface profilers provide fast, angstrom-to-millimeter vertical-range 
metrology over large fields of view, with flexible sample setup and industry leading repeatability. The ContourGT Family is 
the most comprehensive and intuitive 3D surface metrology platform available today for production, research and quality 
control applications.

Unmatched Measurement Capabilities with Highest Vertical Resolution over Industry’s Largest Field of View
■ Magnifications from 0.5X to 200 enable characterization of a wide range of surface shapes and textures
■ Sub-angstrom-to-millimeter vertical range at any magnification delivers unparalleled 
measurement flexibility 
■ High-resolution camera option increases lateral resolution and improves gauge R&R 64-Bit, Multi-Core Processor with Vision64?ar Software for Accelerated 3D Surface Measurement 
and Analyses 
■ New architecture yields order of magnitude increase in application data processing capacity 
■ Parallel processing using multi-core optimization and other techniques provides up to 10 higher throughput on critical metrology analyses 
■ Unmatched stitching capability seamlessly synthesizes thousands of individual datasets into one contiguous image.

Unique Metrology Hardware for Enhanced Reliability and Repeatability in Production Environments 
■ Patented dual-source illumination with super highbrightness LEDs provides superior measurement quality and magnification flexibility 
■ Optimized hardware design improves vibration tolerance and gauge R&R capability 
■ Patented automatic self-calibration capability on selec models ensures tool-to-tool correlation and measurement accuracy and repeatability 
Highly Intuitive User Interface with Best-in-Class Ease of Use, Automation, and Analysis 
■ Streamlined user interface simplifies measurement and data acquisition to increase system and 
personnel efficiency 
■ Unique visual workflow tools provide intuitive access to an extensive library of filters and analysis options 
■ Customized reporting distills analysis data for customerspecific requirements

ContourGT-K1 
Form Factor Bench top; 
Vibration isolation required

XY Sample Stages 150mm (6in) manual; 
Optional programmable 150mm 
(6in) motorized; 
±6o tip-tilt in system base

Z Focusing Stage Motorized, computer controlled; 
Optional joystick controller

Optical Assembly Module Latest generation dual-LED 
illumination source; 
Motorized FOV carousel; 
Automated filter flipper

Objectives Parfocal: 2.5x, 5x, 10, 20, 50 
Long working distance: 2x, 5x, 10

Objective Mounts Single objective adapter or 4-position 
motorized turret

Processor Multi-core, Windows 7.0

System Software Vision64 Operation and Analysis Software

Optional Software Analysis MATLAB

-----------以上信息仅供参考不作为下单依据------------
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